MP-900系列beta射線鍍層測厚儀,beta射線測厚儀MP900
美國UPA beta/貝爾塔射線涂鍍層測厚儀MP-900
美國UPA Micro-Derm鍍層和涂層測厚儀MP-900
β射線反向散射測量技術(shù)
依照標(biāo)準(zhǔn)ASTM B567，ISO/DOS 3543和DIN 50 983的準(zhǔn)則
應(yīng)用在測量許多經(jīng)典結(jié)構(gòu)的鍍層厚度，包括鎳上鍍金（Au/Ni）,環(huán)氧樹脂鍍銅（Cu/epoxy），光致抗蝕劑photoresist，銅上鍍銀（Ag/Cu），科瓦鐵鈷鎳合金上鍍錫Sn/kovar，鐵上鍍氮化鈦Ti-N/Fe，錫鉛合金Sn-Pb。
Micro-Derm MP-900可以利用霍爾效應(yīng)技術(shù)測量銅上鍍鎳（Ni/Cu）的厚度。
探頭系統(tǒng)可以用于精確測量各種樣品表面，從小零件（連接器和端子）到大零件（印制線路板）。
Micro-Derm BBS厚度標(biāo)準(zhǔn)片（4點(diǎn)設(shè)定）包括：純材料的底材，表面鍍層的純材料無限厚片和兩塊經(jīng)過NIST（美國聯(lián)邦標(biāo)準(zhǔn)技術(shù)委員會(huì)）認(rèn)證的標(biāo)準(zhǔn)厚度的薄片。
高質(zhì)量的制造技術(shù)確保盡可能精確的鍍層厚度測量。
設(shè)計(jì)體現(xiàn)了無與倫比的易操作性和高效率。
TESTING INSTRUMENTATION
Micro-Derm MP-900
只有MP900融合了β射線反向散射和霍爾效應(yīng)測量技術(shù)。避免了因?yàn)榇嬖趦煞N需要而購買了兩種儀器的麻煩。
緊湊的設(shè)計(jì)
全面的測量能力
經(jīng)濟(jì)的X射線熒光分析儀器的替代品
提高生產(chǎn)量
45種標(biāo)準(zhǔn)檔案記憶允許用戶快速的進(jìn)行應(yīng)用轉(zhuǎn)換。
獨(dú)特的NOVRAM 設(shè)計(jì)使得即使在備用電源斷電時(shí)仍可以保留有價(jià)值的校準(zhǔn)檔案。
標(biāo)準(zhǔn)校準(zhǔn)模式：4點(diǎn)，3點(diǎn)，2點(diǎn)，線性，多點(diǎn)和Sn-Pb.
特殊的多點(diǎn)Sn-Pb校準(zhǔn)模式可以對(duì)不同的Sn-Pb組分進(jìn)行自動(dòng)補(bǔ)償和修正。
新的3點(diǎn)BBS模式并不需要純材料鍍膜標(biāo)準(zhǔn)片。
多點(diǎn)校正模式應(yīng)用于霍爾效應(yīng)測量（測量鎳厚）。
Micro-Derm MP-700 (已停產(chǎn))
MP700D 精確測量鍍層和涂層的厚度，例如：金，銀，銣，錫，錫鉛合金，銅，鎳，光致抗蝕劑，鋁，鈀和鈦鎢合金。
可以測量任何零件
16組標(biāo)準(zhǔn)檔案存儲(chǔ)
因?yàn)橛袃蓚€(gè)探頭接口，所以用戶可以方便的在兩種應(yīng)用間轉(zhuǎn)換
清晰的顯示屏可以在檢測過程中不斷的提示操作者，減少錯(cuò)誤
LED讀數(shù)顯示測量結(jié)果的單位可以是微英寸（microinches）,微米（micrometers）,毫英寸（mils），埃（angstroms），組分百分含量等。
標(biāo)準(zhǔn)特點(diǎn)包括自動(dòng)診斷測試，錯(cuò)誤檢測，RS-232C 輸出端口
探頭，底座和配件
PS-10A 探頭系統(tǒng)
用于測量微小零件
這種緊湊的輕量的探頭系統(tǒng)特別設(shè)計(jì)用來測量微小的電子原器件，例如：芯片（IC），焊盤，晶體管頭和導(dǎo)線，扁平集成電路，繼電器，終端，針，二極管，連接器，電纜等。
型號(hào)為PS-10A的探頭應(yīng)用了特大直徑的G-M管以便取得更準(zhǔn)確的測量結(jié)果，并且改善了統(tǒng)計(jì)功能。這種G-M管可以在鍍層測試時(shí)探測β射線反射微粒數(shù)量，并且將這種脈沖信號(hào)傳送給Micro-Derm主機(jī)，在主機(jī)里這種脈沖信號(hào)被轉(zhuǎn)換成數(shù)字顯示的厚度讀數(shù)。
可互換的放射源/光圈組件
獨(dú)特的放射源環(huán)和光圈盤組件模塊確保了簡單的易更換性，可以方便的重組大量的放射源-光圈組合，從而可以測量幾乎所有的小零件。
各種尺寸和型號(hào)的光圈盤配置可以方便的對(duì)測量面積進(jìn)行精確限定。每種放射源和用戶指定的光圈盤一起配套成為放射源/光圈組件模組。
光圈盤是由硬質(zhì)耐磨不銹鋼制成，并且可以作成圓形或者長方形。彈簧針將測試件牢牢固定住，暴露在光圈盤開窗下的測試件區(qū)域的鍍層厚度將被測試出來。
光圈器固定裝置
對(duì)于難以定位的測試件，UPA為客戶提供了光圈器固定裝置。網(wǎng)格固定裝置可以對(duì)特殊零件進(jìn)行更為方便的定位，例如焊盤，小連接器，導(dǎo)線，等。這種完整的組件是由零件固定器設(shè)備和配套的精確光圈盤組成。
CB-5型底座
專門用于印制線路板測試
這種新專利的線路板型CB-5底座，可以為在印制線路板上的表面鍍層厚度進(jìn)行出乎意外的快速和精確測量。
通過這種獨(dú)特的光學(xué)定位系統(tǒng)，CB-5就可以方便地將HH-3測試探頭（見上頁）定位在線路板上的微小區(qū)域內(nèi)。將CB-5放置在線路板上，線路板上的被檢測點(diǎn)將被照亮，并不需要類似十字準(zhǔn)線式的對(duì)準(zhǔn)方法進(jìn)行對(duì)準(zhǔn)。
既然CB-5底座可以移動(dòng)到線路板上的任何位置，那么它就可以對(duì)即使處于特大型線路板的中心位置這樣類似難以檢測的區(qū)域進(jìn)行測試。通過利用C-3卡子和HH-3探頭系統(tǒng)就可以快速的對(duì)放置在CB-5中的探頭進(jìn)行更換。
Micro-Derm探頭和底座
HH-3探頭
一套獨(dú)立的探頭系統(tǒng)包括一個(gè)盛裝β射線放射源（Pm,Tl,Sr）的探頭桶MB-3,一個(gè)Geiger-MullerG-M管，一個(gè)樣品罩。
這種多樣化的探頭可以和多種探頭底座和支架相配套，從而可以確保對(duì)各種尺寸和形狀的零件進(jìn)行測量，例如線路板，圓柱，制罐用薄板材料，平板，底盤，小零件。
HH-4探頭
這種緊湊的獨(dú)立的探頭系統(tǒng)確保可以測量直徑小至0.5"12.7mm內(nèi)曲面或內(nèi)
平面的激光視盤。這種獨(dú)特的配置可以使β射線微粒從探頭側(cè)面開窗發(fā)射出來。可以測量軸承、環(huán)狀物、管子、波導(dǎo)、圓柱等內(nèi)側(cè)表面的金、銠、銀、石墨、錫鉛合金以及其它鍍層的厚度。
TR-1探頭系統(tǒng)
這種探頭用于測量高密硬盤，金屬薄片，膠帶，硅晶片，等。用探頭TR-1把樣品放置在β射線放射源和G-M管探測器之間進(jìn)行測量是非接觸的，這樣就允許不斷的移動(dòng)金屬薄片和膠帶進(jìn)行測量，需要配置Tl放射源。
TR-1探頭系統(tǒng)提供非接觸的測量。
小零件探頭底座SPG-1
這種底座用于定位HH-3探頭對(duì)小型電子零件進(jìn)行測量，比如連接器，針頭，焊盤，電線，扁平集成電路和接觸端。樣品固定壓力針可以安全的固定樣品。這種底座可以確保同樣的標(biāo)準(zhǔn)HH-3探頭既可以用于測量有巨大的表面的零件，也可以測量小型零部件。
我們專業(yè)的應(yīng)用工程師將很高興為適應(yīng)您的特殊的測量應(yīng)用的需要而配置挑選合適的零部件。
座臺(tái)式：
Microderm MP-900
Beta Backscatter and Hall Effect System!
Microderm MP-900
For companies that prefer a benchtop model
- Measures many typical thickness applications, including gold on nickel, copper on epoxy, photoresist, silver on copper, tin on kovar, titanium nitrate on steel, tin-lead alloys
- Microderm Beta Backscatter thickness standards (4 point sets) consist of a bare sample of base material, a sample of infinitely thick coating material, and two thickness standards certified traceable to the NIST (National Institute of Standards Technology)
- Can measure nickel thickness on copper using the Hall effect
- Each measurement system comes complete with a benchtop measuring instrument, a measuring probe and guide, and thickness standards
- Designed for unmatched ease-of-use and efficiency
Probes
All Microderm probes work with either the handheld or benchtop model
HH3 Probe
- Self contained probe system consisting of a probe barrel, beta source, Geiger-Muller tube sensor, specimen mask, and case assembly.
- Can be used with any of several probe guides and stands, enabling measurement on almost any size or shape of part.
WF Probe Guide
- The WF probe guide is used with the HH-3 or HH-2 probe and attaches in seconds without tools.
- This handy probe guide is balanced with a metal outer ring, which encircles a polished Lucite core.
- The guide holds the probe steady on horizontal surfaces.
SPG-1 Small Parts Probe Guide
- Uses an HH-3 probe and attaches in seconds without tools.
- A spring-mounted pressure pin holds small parts securely on the HH-3 probe for accurate, repeatable measurements.
The PS-10A Probe Table
- Allows precise, instant alignment of very small parts. Electronic components such as connectors, contacts, pins, and terminals are readily measured with the probe system
- A spring-loaded pressure pin securely hold parts steady.
Beta Thin Films "BTF" Probe
- Measures wet or dry coatings such as stamping lubricants, primers and adhesives on flat parts.
- Extremely thin organic and metal film coatings are accurately measured
手持式：
Microderm CMS, Benchtop, and Probes
Microderm CMS
The World‘s First Portable BetaBackscatter Device
The UPA Microderm CMS is a handheld unit perfect for process-line operation. Its menu-driven interactive software and re-charging docking station with spare battery pack makes it versatile and easy to use. It offers a data management software with 100 applications, 40 calibrations, and 10,000 measurements. Statistics include mean, standard deviation, highest/lowest measurement, and range.
- A wide variety of probes and probe stands allows measurement on almost any size or shape of part
- Menu-driven, user-friendly software, and an easy-to-read backlit display
- Ergonomic instrument design for unmatched ease of use and efficiency
- Rechargeable NiMH batteries provide up to 20 hours of continuous measuring between recharges
- Recharging base also functions as a benchtop stand
- Calibrates in minutes using NIST traceable standards
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MicrodermCMSSpecifications:
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Dimensions
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9.5" X 5.0" X 2.5" (250 mm x 125 mm x 62.5 cm)
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Weight
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1.5 lbs. (0.65 kg)
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Display
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2" X 2.4" (50mm x 60mm) backlit viewing area 320 x 240 pixels; 1/4 VGA
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Memory
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100 applications; 20 calibrations; 350,000 measurement storage
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Statistics
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Mean, standard deviation, max/min, and range
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Data Port
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9-Pin Serial to USB
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Batteries
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Rechargeable, NiMH batteries
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Typical Applications Include
- Adhesive / Steel, Aluminum, Glass
- Aluminum / Kovar, Steel, Glass, Silicon
- Aluminide / Nickel Alloys
- Babbitt / Bronze, Brass, Copper, Iron
- Copper / Aluminum, Beryllium, Carbon, Ceramic, Plastic
- Chromium / Copper, Aluminum
- Cadmium / Steel, Brass, Stainless Steel
- Electroless Nickel / Aluminum, Plastic
- Gold / Nickel, Copper, Silicon, Ceramic
- Iron Oxide / Mylar
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- Lead / Brass, Bronze
- Lubricants / Steel, Aluminum, Brass, Copper
- Mylar Film Thickness
- Nickel / Aluminum, Beryllium
- Palladium / Nickel
- PhotoResist / Copper
- Platinum / Nickel
- Primer / Glass
- Rhodium / Nickel, Copper, Gold
- Silver / Copper, Nickel, Ceramic
- Silicon / Plastic
- Solder / Copper, Brass
- Tantalum / Glass
- Tin / Copper, Brass, Steel
- Tin-Nickel / Nickel
- Titanium Nitride / Steel, Stainless Steel
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Microderm Technology is also used for the precise measurement of stamping lubricants
- No additives are necessary for measuring lubricants
- Measures lubricants on any metal substrate
- All lubricants are measured using a single calibration
- Independent testing confirms correlation to weigh/strip/weigh
- Used by Toyota, Ford, Chrysler, and Nissan
MP-900系列beta射線鍍層測厚儀,beta射線測厚儀MP900
美國UPA beta/貝爾塔射線涂鍍層測厚儀MP-900
美國UPA Micro-Derm鍍層和涂層測厚儀MP-900
β射線反向散射測量技術(shù)
依照標(biāo)準(zhǔn)ASTM B567，ISO/DOS 3543和DIN 50 983的準(zhǔn)則
應(yīng)用在測量許多經(jīng)典結(jié)構(gòu)的鍍層厚度，包括鎳上鍍金（Au/Ni）,環(huán)氧樹脂鍍銅（Cu/epoxy），光致抗蝕劑photoresist，銅上鍍銀（Ag/Cu），科瓦鐵鈷鎳合金上鍍錫Sn/kovar，鐵上鍍氮化鈦Ti-N/Fe，錫鉛合金Sn-Pb。
Micro-Derm MP-900可以利用霍爾效應(yīng)技術(shù)測量銅上鍍鎳（Ni/Cu）的厚度。
探頭系統(tǒng)可以用于精確測量各種樣品表面，從小零件（連接器和端子）到大零件（印制線路板）。
Micro-Derm BBS厚度標(biāo)準(zhǔn)片（4點(diǎn)設(shè)定）包括：純材料的底材，表面鍍層的純材料無限厚片和兩塊經(jīng)過NIST（美國聯(lián)邦標(biāo)準(zhǔn)技術(shù)委員會(huì)）認(rèn)證的標(biāo)準(zhǔn)厚度的薄片。
高質(zhì)量的制造技術(shù)確保盡可能精確的鍍層厚度測量。
設(shè)計(jì)體現(xiàn)了無與倫比的易操作性和高效率。
TESTING INSTRUMENTATION
Micro-Derm MP-900
只有MP900融合了β射線反向散射和霍爾效應(yīng)測量技術(shù)。避免了因?yàn)榇嬖趦煞N需要而購買了兩種儀器的麻煩。
緊湊的設(shè)計(jì)
全面的測量能力
經(jīng)濟(jì)的X射線熒光分析儀器的替代品
提高生產(chǎn)量
45種標(biāo)準(zhǔn)檔案記憶允許用戶快速的進(jìn)行應(yīng)用轉(zhuǎn)換。
獨(dú)特的NOVRAM 設(shè)計(jì)使得即使在備用電源斷電時(shí)仍可以保留有價(jià)值的校準(zhǔn)檔案。
標(biāo)準(zhǔn)校準(zhǔn)模式：4點(diǎn)，3點(diǎn)，2點(diǎn)，線性，多點(diǎn)和Sn-Pb.
特殊的多點(diǎn)Sn-Pb校準(zhǔn)模式可以對(duì)不同的Sn-Pb組分進(jìn)行自動(dòng)補(bǔ)償和修正。
新的3點(diǎn)BBS模式并不需要純材料鍍膜標(biāo)準(zhǔn)片。
多點(diǎn)校正模式應(yīng)用于霍爾效應(yīng)測量（測量鎳厚）。
Micro-Derm MP-700 (已停產(chǎn))
MP700D 精確測量鍍層和涂層的厚度，例如：金，銀，銣，錫，錫鉛合金，銅，鎳，光致抗蝕劑，鋁，鈀和鈦鎢合金。
可以測量任何零件
16組標(biāo)準(zhǔn)檔案存儲(chǔ)
因?yàn)橛袃蓚€(gè)探頭接口，所以用戶可以方便的在兩種應(yīng)用間轉(zhuǎn)換
清晰的顯示屏可以在檢測過程中不斷的提示操作者，減少錯(cuò)誤
LED讀數(shù)顯示測量結(jié)果的單位可以是微英寸（microinches）,微米（micrometers）,毫英寸（mils），埃（angstroms），組分百分含量等。
標(biāo)準(zhǔn)特點(diǎn)包括自動(dòng)診斷測試，錯(cuò)誤檢測，RS-232C 輸出端口
探頭，底座和配件
PS-10A 探頭系統(tǒng)
用于測量微小零件
這種緊湊的輕量的探頭系統(tǒng)特別設(shè)計(jì)用來測量微小的電子原器件，例如：芯片（IC），焊盤，晶體管頭和導(dǎo)線，扁平集成電路，繼電器，終端，針，二極管，連接器，電纜等。
型號(hào)為PS-10A的探頭應(yīng)用了特大直徑的G-M管以便取得更準(zhǔn)確的測量結(jié)果，并且改善了統(tǒng)計(jì)功能。這種G-M管可以在鍍層測試時(shí)探測β射線反射微粒數(shù)量，并且將這種脈沖信號(hào)傳送給Micro-Derm主機(jī)，在主機(jī)里這種脈沖信號(hào)被轉(zhuǎn)換成數(shù)字顯示的厚度讀數(shù)。
可互換的放射源/光圈組件
獨(dú)特的放射源環(huán)和光圈盤組件模塊確保了簡單的易更換性，可以方便的重組大量的放射源-光圈組合，從而可以測量幾乎所有的小零件。
各種尺寸和型號(hào)的光圈盤配置可以方便的對(duì)測量面積進(jìn)行精確限定。每種放射源和用戶指定的光圈盤一起配套成為放射源/光圈組件模組。
光圈盤是由硬質(zhì)耐磨不銹鋼制成，并且可以作成圓形或者長方形。彈簧針將測試件牢牢固定住，暴露在光圈盤開窗下的測試件區(qū)域的鍍層厚度將被測試出來。
光圈器固定裝置
對(duì)于難以定位的測試件，UPA為客戶提供了光圈器固定裝置。網(wǎng)格固定裝置可以對(duì)特殊零件進(jìn)行更為方便的定位，例如焊盤，小連接器，導(dǎo)線，等。這種完整的組件是由零件固定器設(shè)備和配套的精確光圈盤組成。
CB-5型底座
專門用于印制線路板測試
這種新專利的線路板型CB-5底座，可以為在印制線路板上的表面鍍層厚度進(jìn)行出乎意外的快速和精確測量。
通過這種獨(dú)特的光學(xué)定位系統(tǒng)，CB-5就可以方便地將HH-3測試探頭（見上頁）定位在線路板上的微小區(qū)域內(nèi)。將CB-5放置在線路板上，線路板上的被檢測點(diǎn)將被照亮，并不需要類似十字準(zhǔn)線式的對(duì)準(zhǔn)方法進(jìn)行對(duì)準(zhǔn)。
既然CB-5底座可以移動(dòng)到線路板上的任何位置，那么它就可以對(duì)即使處于特大型線路板的中心位置這樣類似難以檢測的區(qū)域進(jìn)行測試。通過利用C-3卡子和HH-3探頭系統(tǒng)就可以快速的對(duì)放置在CB-5中的探頭進(jìn)行更換。
Micro-Derm探頭和底座
HH-3探頭
一套獨(dú)立的探頭系統(tǒng)包括一個(gè)盛裝β射線放射源（Pm,Tl,Sr）的探頭桶MB-3,一個(gè)Geiger-MullerG-M管，一個(gè)樣品罩。
這種多樣化的探頭可以和多種探頭底座和支架相配套，從而可以確保對(duì)各種尺寸和形狀的零件進(jìn)行測量，例如線路板，圓柱，制罐用薄板材料，平板，底盤，小零件。
HH-4探頭
這種緊湊的獨(dú)立的探頭系統(tǒng)確保可以測量直徑小至0.5"12.7mm內(nèi)曲面或內(nèi)
平面的激光視盤。這種獨(dú)特的配置可以使β射線微粒從探頭側(cè)面開窗發(fā)射出來?？梢詼y量軸承、環(huán)狀物、管子、波導(dǎo)、圓柱等內(nèi)側(cè)表面的金、銠、銀、石墨、錫鉛合金以及其它鍍層的厚度。
TR-1探頭系統(tǒng)
這種探頭用于測量高密硬盤，金屬薄片，膠帶，硅晶片，等。用探頭TR-1把樣品放置在β射線放射源和G-M管探測器之間進(jìn)行測量是非接觸的，這樣就允許不斷的移動(dòng)金屬薄片和膠帶進(jìn)行測量，需要配置Tl放射源。
TR-1探頭系統(tǒng)提供非接觸的測量。
小零件探頭底座SPG-1
這種底座用于定位HH-3探頭對(duì)小型電子零件進(jìn)行測量，比如連接器，針頭，焊盤，電線，扁平集成電路和接觸端。樣品固定壓力針可以安全的固定樣品。這種底座可以確保同樣的標(biāo)準(zhǔn)HH-3探頭既可以用于測量有巨大的表面的零件，也可以測量小型零部件。
我們專業(yè)的應(yīng)用工程師將很高興為適應(yīng)您的特殊的測量應(yīng)用的需要而配置挑選合適的零部件。
座臺(tái)式：
Microderm MP-900
Beta Backscatter and Hall Effect System!
Microderm MP-900
For companies that prefer a benchtop model
- Measures many typical thickness applications, including gold on nickel, copper on epoxy, photoresist, silver on copper, tin on kovar, titanium nitrate on steel, tin-lead alloys
- Microderm Beta Backscatter thickness standards (4 point sets) consist of a bare sample of base material, a sample of infinitely thick coating material, and two thickness standards certified traceable to the NIST (National Institute of Standards Technology)
- Can measure nickel thickness on copper using the Hall effect
- Each measurement system comes complete with a benchtop measuring instrument, a measuring probe and guide, and thickness standards
- Designed for unmatched ease-of-use and efficiency
Probes
All Microderm probes work with either the handheld or benchtop model
HH3 Probe
- Self contained probe system consisting of a probe barrel, beta source, Geiger-Muller tube sensor, specimen mask, and case assembly.
- Can be used with any of several probe guides and stands, enabling measurement on almost any size or shape of part.
WF Probe Guide
- The WF probe guide is used with the HH-3 or HH-2 probe and attaches in seconds without tools.
- This handy probe guide is balanced with a metal outer ring, which encircles a polished Lucite core.
- The guide holds the probe steady on horizontal surfaces.
SPG-1 Small Parts Probe Guide
- Uses an HH-3 probe and attaches in seconds without tools.
- A spring-mounted pressure pin holds small parts securely on the HH-3 probe for accurate, repeatable measurements.
The PS-10A Probe Table
- Allows precise, instant alignment of very small parts. Electronic components such as connectors, contacts, pins, and terminals are readily measured with the probe system
- A spring-loaded pressure pin securely hold parts steady.
Beta Thin Films "BTF" Probe
- Measures wet or dry coatings such as stamping lubricants, primers and adhesives on flat parts.
- Extremely thin organic and metal film coatings are accurately measured
手持式：
Microderm CMS, Benchtop, and Probes
Microderm CMS
The World‘s First Portable BetaBackscatter Device
The UPA Microderm CMS is a handheld unit perfect for process-line operation. Its menu-driven interactive software and re-charging docking station with spare battery pack makes it versatile and easy to use. It offers a data management software with 100 applications, 40 calibrations, and 10,000 measurements. Statistics include mean, standard deviation, highest/lowest measurement, and range.
- A wide variety of probes and probe stands allows measurement on almost any size or shape of part
- Menu-driven, user-friendly software, and an easy-to-read backlit display
- Ergonomic instrument design for unmatched ease of use and efficiency
- Rechargeable NiMH batteries provide up to 20 hours of continuous measuring between recharges
- Recharging base also functions as a benchtop stand
- Calibrates in minutes using NIST traceable standards
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MicrodermCMSSpecifications:
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Dimensions
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9.5" X 5.0" X 2.5" (250 mm x 125 mm x 62.5 cm)
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Weight
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1.5 lbs. (0.65 kg)
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Display
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2" X 2.4" (50mm x 60mm) backlit viewing area 320 x 240 pixels; 1/4 VGA
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Memory
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100 applications; 20 calibrations; 350,000 measurement storage
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|
Statistics
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Mean, standard deviation, max/min, and range
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Data Port
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9-Pin Serial to USB
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Batteries
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Rechargeable, NiMH batteries
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Typical Applications Include
- Adhesive / Steel, Aluminum, Glass
- Aluminum / Kovar, Steel, Glass, Silicon
- Aluminide / Nickel Alloys
- Babbitt / Bronze, Brass, Copper, Iron
- Copper / Aluminum, Beryllium, Carbon, Ceramic, Plastic
- Chromium / Copper, Aluminum
- Cadmium / Steel, Brass, Stainless Steel
- Electroless Nickel / Aluminum, Plastic
- Gold / Nickel, Copper, Silicon, Ceramic
- Iron Oxide / Mylar
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- Lead / Brass, Bronze
- Lubricants / Steel, Aluminum, Brass, Copper
- Mylar Film Thickness
- Nickel / Aluminum, Beryllium
- Palladium / Nickel
- PhotoResist / Copper
- Platinum / Nickel
- Primer / Glass
- Rhodium / Nickel, Copper, Gold
- Silver / Copper, Nickel, Ceramic
- Silicon / Plastic
- Solder / Copper, Brass
- Tantalum / Glass
- Tin / Copper, Brass, Steel
- Tin-Nickel / Nickel
- Titanium Nitride / Steel, Stainless Steel
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Microderm Technology is also used for the precise measurement of stamping lubricants
- No additives are necessary for measuring lubricants
- Measures lubricants on any metal substrate
- All lubricants are measured using a single calibration
- Independent testing confirms correlation to weigh/strip/weigh
- Used by Toyota, Ford, Chrysler, and Nissan
MP-900系列beta射線鍍層測厚儀,beta射線測厚儀MP900
美國UPA beta/貝爾塔射線涂鍍層測厚儀MP-900
美國UPA Micro-Derm鍍層和涂層測厚儀MP-900
β射線反向散射測量技術(shù)
依照標(biāo)準(zhǔn)ASTM B567，ISO/DOS 3543和DIN 50 983的準(zhǔn)則
應(yīng)用在測量許多經(jīng)典結(jié)構(gòu)的鍍層厚度，包括鎳上鍍金（Au/Ni）,環(huán)氧樹脂鍍銅（Cu/epoxy），光致抗蝕劑photoresist，銅上鍍銀（Ag/Cu），科瓦鐵鈷鎳合金上鍍錫Sn/kovar，鐵上鍍氮化鈦Ti-N/Fe，錫鉛合金Sn-Pb。
Micro-Derm MP-900可以利用霍爾效應(yīng)技術(shù)測量銅上鍍鎳（Ni/Cu）的厚度。
探頭系統(tǒng)可以用于精確測量各種樣品表面，從小零件（連接器和端子）到大零件（印制線路板）。
Micro-Derm BBS厚度標(biāo)準(zhǔn)片（4點(diǎn)設(shè)定）包括：純材料的底材，表面鍍層的純材料無限厚片和兩塊經(jīng)過NIST（美國聯(lián)邦標(biāo)準(zhǔn)技術(shù)委員會(huì)）認(rèn)證的標(biāo)準(zhǔn)厚度的薄片。
高質(zhì)量的制造技術(shù)確保盡可能精確的鍍層厚度測量。
設(shè)計(jì)體現(xiàn)了無與倫比的易操作性和高效率。
TESTING INSTRUMENTATION
Micro-Derm MP-900
只有MP900融合了β射線反向散射和霍爾效應(yīng)測量技術(shù)。避免了因?yàn)榇嬖趦煞N需要而購買了兩種儀器的麻煩。
緊湊的設(shè)計(jì)
全面的測量能力
經(jīng)濟(jì)的X射線熒光分析儀器的替代品
提高生產(chǎn)量
45種標(biāo)準(zhǔn)檔案記憶允許用戶快速的進(jìn)行應(yīng)用轉(zhuǎn)換。
獨(dú)特的NOVRAM 設(shè)計(jì)使得即使在備用電源斷電時(shí)仍可以保留有價(jià)值的校準(zhǔn)檔案。
標(biāo)準(zhǔn)校準(zhǔn)模式：4點(diǎn)，3點(diǎn)，2點(diǎn)，線性，多點(diǎn)和Sn-Pb.
特殊的多點(diǎn)Sn-Pb校準(zhǔn)模式可以對(duì)不同的Sn-Pb組分進(jìn)行自動(dòng)補(bǔ)償和修正。
新的3點(diǎn)BBS模式并不需要純材料鍍膜標(biāo)準(zhǔn)片。
多點(diǎn)校正模式應(yīng)用于霍爾效應(yīng)測量（測量鎳厚）。
Micro-Derm MP-700 (已停產(chǎn))
MP700D 精確測量鍍層和涂層的厚度，例如：金，銀，銣，錫，錫鉛合金，銅，鎳，光致抗蝕劑，鋁，鈀和鈦鎢合金。
可以測量任何零件
16組標(biāo)準(zhǔn)檔案存儲(chǔ)
因?yàn)橛袃蓚€(gè)探頭接口，所以用戶可以方便的在兩種應(yīng)用間轉(zhuǎn)換
清晰的顯示屏可以在檢測過程中不斷的提示操作者，減少錯(cuò)誤
LED讀數(shù)顯示測量結(jié)果的單位可以是微英寸（microinches）,微米（micrometers）,毫英寸（mils），埃（angstroms），組分百分含量等。
標(biāo)準(zhǔn)特點(diǎn)包括自動(dòng)診斷測試，錯(cuò)誤檢測，RS-232C 輸出端口
探頭，底座和配件
PS-10A 探頭系統(tǒng)
用于測量微小零件
這種緊湊的輕量的探頭系統(tǒng)特別設(shè)計(jì)用來測量微小的電子原器件，例如：芯片（IC），焊盤，晶體管頭和導(dǎo)線，扁平集成電路，繼電器，終端，針，二極管，連接器，電纜等。
型號(hào)為PS-10A的探頭應(yīng)用了特大直徑的G-M管以便取得更準(zhǔn)確的測量結(jié)果，并且改善了統(tǒng)計(jì)功能。這種G-M管可以在鍍層測試時(shí)探測β射線反射微粒數(shù)量，并且將這種脈沖信號(hào)傳送給Micro-Derm主機(jī)，在主機(jī)里這種脈沖信號(hào)被轉(zhuǎn)換成數(shù)字顯示的厚度讀數(shù)。
可互換的放射源/光圈組件
獨(dú)特的放射源環(huán)和光圈盤組件模塊確保了簡單的易更換性，可以方便的重組大量的放射源-光圈組合，從而可以測量幾乎所有的小零件。
各種尺寸和型號(hào)的光圈盤配置可以方便的對(duì)測量面積進(jìn)行精確限定。每種放射源和用戶指定的光圈盤一起配套成為放射源/光圈組件模組。
光圈盤是由硬質(zhì)耐磨不銹鋼制成，并且可以作成圓形或者長方形。彈簧針將測試件牢牢固定住，暴露在光圈盤開窗下的測試件區(qū)域的鍍層厚度將被測試出來。
光圈器固定裝置
對(duì)于難以定位的測試件，UPA為客戶提供了光圈器固定裝置。網(wǎng)格固定裝置可以對(duì)特殊零件進(jìn)行更為方便的定位，例如焊盤，小連接器，導(dǎo)線，等。這種完整的組件是由零件固定器設(shè)備和配套的精確光圈盤組成。
CB-5型底座
專門用于印制線路板測試
這種新專利的線路板型CB-5底座，可以為在印制線路板上的表面鍍層厚度進(jìn)行出乎意外的快速和精確測量。
通過這種獨(dú)特的光學(xué)定位系統(tǒng)，CB-5就可以方便地將HH-3測試探頭（見上頁）定位在線路板上的微小區(qū)域內(nèi)。將CB-5放置在線路板上，線路板上的被檢測點(diǎn)將被照亮，并不需要類似十字準(zhǔn)線式的對(duì)準(zhǔn)方法進(jìn)行對(duì)準(zhǔn)。
既然CB-5底座可以移動(dòng)到線路板上的任何位置，那么它就可以對(duì)即使處于特大型線路板的中心位置這樣類似難以檢測的區(qū)域進(jìn)行測試。通過利用C-3卡子和HH-3探頭系統(tǒng)就可以快速的對(duì)放置在CB-5中的探頭進(jìn)行更換。
Micro-Derm探頭和底座
HH-3探頭
一套獨(dú)立的探頭系統(tǒng)包括一個(gè)盛裝β射線放射源（Pm,Tl,Sr）的探頭桶MB-3,一個(gè)Geiger-MullerG-M管，一個(gè)樣品罩。
這種多樣化的探頭可以和多種探頭底座和支架相配套，從而可以確保對(duì)各種尺寸和形狀的零件進(jìn)行測量，例如線路板，圓柱，制罐用薄板材料，平板，底盤，小零件。
HH-4探頭
這種緊湊的獨(dú)立的探頭系統(tǒng)確保可以測量直徑小至0.5"12.7mm內(nèi)曲面或內(nèi)
平面的激光視盤。這種獨(dú)特的配置可以使β射線微粒從探頭側(cè)面開窗發(fā)射出來?？梢詼y量軸承、環(huán)狀物、管子、波導(dǎo)、圓柱等內(nèi)側(cè)表面的金、銠、銀、石墨、錫鉛合金以及其它鍍層的厚度。
TR-1探頭系統(tǒng)
這種探頭用于測量高密硬盤，金屬薄片，膠帶，硅晶片，等。用探頭TR-1把樣品放置在β射線放射源和G-M管探測器之間進(jìn)行測量是非接觸的，這樣就允許不斷的移動(dòng)金屬薄片和膠帶進(jìn)行測量，需要配置Tl放射源。
TR-1探頭系統(tǒng)提供非接觸的測量。
小零件探頭底座SPG-1
這種底座用于定位HH-3探頭對(duì)小型電子零件進(jìn)行測量，比如連接器，針頭，焊盤，電線，扁平集成電路和接觸端。樣品固定壓力針可以安全的固定樣品。這種底座可以確保同樣的標(biāo)準(zhǔn)HH-3探頭既可以用于測量有巨大的表面的零件，也可以測量小型零部件。
我們專業(yè)的應(yīng)用工程師將很高興為適應(yīng)您的特殊的測量應(yīng)用的需要而配置挑選合適的零部件。
座臺(tái)式：
Microderm MP-900
Beta Backscatter and Hall Effect System!
Microderm MP-900
For companies that prefer a benchtop model
- Measures many typical thickness applications, including gold on nickel, copper on epoxy, photoresist, silver on copper, tin on kovar, titanium nitrate on steel, tin-lead alloys
- Microderm Beta Backscatter thickness standards (4 point sets) consist of a bare sample of base material, a sample of infinitely thick coating material, and two thickness standards certified traceable to the NIST (National Institute of Standards Technology)
- Can measure nickel thickness on copper using the Hall effect
- Each measurement system comes complete with a benchtop measuring instrument, a measuring probe and guide, and thickness standards
- Designed for unmatched ease-of-use and efficiency
Probes
All Microderm probes work with either the handheld or benchtop model
HH3 Probe
- Self contained probe system consisting of a probe barrel, beta source, Geiger-Muller tube sensor, specimen mask, and case assembly.
- Can be used with any of several probe guides and stands, enabling measurement on almost any size or shape of part.
WF Probe Guide
- The WF probe guide is used with the HH-3 or HH-2 probe and attaches in seconds without tools.
- This handy probe guide is balanced with a metal outer ring, which encircles a polished Lucite core.
- The guide holds the probe steady on horizontal surfaces.
SPG-1 Small Parts Probe Guide
- Uses an HH-3 probe and attaches in seconds without tools.
- A spring-mounted pressure pin holds small parts securely on the HH-3 probe for accurate, repeatable measurements.
The PS-10A Probe Table
- Allows precise, instant alignment of very small parts. Electronic components such as connectors, contacts, pins, and terminals are readily measured with the probe system
- A spring-loaded pressure pin securely hold parts steady.
Beta Thin Films "BTF" Probe
- Measures wet or dry coatings such as stamping lubricants, primers and adhesives on flat parts.
- Extremely thin organic and metal film coatings are accurately measured
手持式：
Microderm CMS, Benchtop, and Probes
Microderm CMS
The World‘s First Portable BetaBackscatter Device
The UPA Microderm CMS is a handheld unit perfect for process-line operation. Its menu-driven interactive software and re-charging docking station with spare battery pack makes it versatile and easy to use. It offers a data management software with 100 applications, 40 calibrations, and 10,000 measurements. Statistics include mean, standard deviation, highest/lowest measurement, and range.
- A wide variety of probes and probe stands allows measurement on almost any size or shape of part
- Menu-driven, user-friendly software, and an easy-to-read backlit display
- Ergonomic instrument design for unmatched ease of use and efficiency
- Rechargeable NiMH batteries provide up to 20 hours of continuous measuring between recharges
- Recharging base also functions as a benchtop stand
- Calibrates in minutes using NIST traceable standards
|
MicrodermCMSSpecifications:
|
|
Dimensions
|
9.5" X 5.0" X 2.5" (250 mm x 125 mm x 62.5 cm)
|
|
Weight
|
1.5 lbs. (0.65 kg)
|
|
Display
|
2" X 2.4" (50mm x 60mm) backlit viewing area 320 x 240 pixels; 1/4 VGA
|
|
Memory
|
100 applications; 20 calibrations; 350,000 measurement storage
|
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Statistics
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Mean, standard deviation, max/min, and range
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Data Port
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9-Pin Serial to USB
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Batteries
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Rechargeable, NiMH batteries
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Typical Applications Include
- Adhesive / Steel, Aluminum, Glass
- Aluminum / Kovar, Steel, Glass, Silicon
- Aluminide / Nickel Alloys
- Babbitt / Bronze, Brass, Copper, Iron
- Copper / Aluminum, Beryllium, Carbon, Ceramic, Plastic
- Chromium / Copper, Aluminum
- Cadmium / Steel, Brass, Stainless Steel
- Electroless Nickel / Aluminum, Plastic
- Gold / Nickel, Copper, Silicon, Ceramic
- Iron Oxide / Mylar
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- Lead / Brass, Bronze
- Lubricants / Steel, Aluminum, Brass, Copper
- Mylar Film Thickness
- Nickel / Aluminum, Beryllium
- Palladium / Nickel
- PhotoResist / Copper
- Platinum / Nickel
- Primer / Glass
- Rhodium / Nickel, Copper, Gold
- Silver / Copper, Nickel, Ceramic
- Silicon / Plastic
- Solder / Copper, Brass
- Tantalum / Glass
- Tin / Copper, Brass, Steel
- Tin-Nickel / Nickel
- Titanium Nitride / Steel, Stainless Steel
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Microderm Technology is also used for the precise measurement of stamping lubricants
- No additives are necessary for measuring lubricants
- Measures lubricants on any metal substrate
- All lubricants are measured using a single calibration
- Independent testing confirms correlation to weigh/strip/weigh
- Used by Toyota, Ford, Chrysler, and Nissan
Xray Compact eco
$Xray Compact eco
德國金屬鍍層測厚儀Compact eco
$Compact eco
CMI243金屬鍍層測厚儀
$CMI200/CMI243
MP900鍍層測厚儀
$MP900/MP700
汽車玻璃表面油膜厚度測量儀CMS
$玻璃表面油膜厚度測量儀
CMS beta射線測厚儀
$CMS beta射線測厚儀
手持式β射線測量儀器CMS
$CMS
金屬鍍層測厚儀compacteco
$Roentgenanalytik
X射線熒光分析儀compact eco
$compact eco